By George M. Crankovic
This quantity will give you an simply understood reference publication on sleek analytical options. With over 950 illustrations and ninety five tables, the emphasis is at the functional instead of theoretical, describing the most typical purposes and barriers of every technique.
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Extra resources for ASM Handbook: Materials Characterization
The intensities of the lines are usually proportional to the number of atoms producing them. The presence of an element in a sample is indicated by the presence in light from the excitation source of one or more of its characteristic lines. The concentration of that element can be determined by measuring line intensities. Thus, the characteristic emission spectrum forms the basis for qualitative elemental analysis, and the measurement of intensities of the emission lines forms the basis of quantitative elemental analysis.
Atomic line profiles produced by any of the above effects can be altered by self-absorption. At high concentrations of atoms in the spectroscopic source, the probability is reasonable that the radiation an atom emits will be absorbed by another atom of the same type. The probability of absorption is greater at wavelengths near the center of the line profile than at wavelengths near the wings. The emission profiles observed under such conditions are flatter and broader than those observed in the absence of self-absorption.
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